Characterisation

A wide range of characterisation techniques including SEM/TEM/STEM, FIB, FIM/3DAP, NanoSIMS, STM etc.

Lead Academic Staff: Paul Bagot, Harish Bhaskaran, Peter Bruce, Martin Castell, Nicole Grobert, Chris Grovenor, Judy Kim, Angus Kirkland, Sergio Lozano-Perez, Michael Moody, Pete Nellist, Mauro Pasta, Susie Speller, Rob Weatherup, Angus J Wilkinson

Related Websites:

Christopher Allen

Senior Research Staff, ePSIC Principal Scientist

Paul Bagot

Atom Probe Group Leader/Senior Atom Probe Scientist

Harish Bhaskaran FREng

Professor of Applied Nanomaterials, Associate Head of Division (Research)

Sir Peter Bruce FRS

Wolfson Chair, Professor of Materials

Martin Castell

Professor of Materials, Associate Head of Division (Taught Degrees)

Nicole Grobert

Professor of Nanomaterials

Judy Kim

Departmental Lecturer in Aberration Corrected Transmission Electron Microscopy

Angus Kirkland

Professor of Materials

Sergio Lozano-Perez

George Kelley Professor of Materials

Katharina (Tinka) Marquardt (she/her)

Associate Professor of Materials Microscopy and Microstructure Evolution

Michael Moody

Academic Visitor

Peter Nellist FRS

Professor of Materials

Susie Speller

Professor of Materials Science

Robert Weatherup

Associate Professor of Materials

Angus J Wilkinson

Professor of Materials (he/him*)