Peter Nellist

Selected Publications

  • The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials.

  • Targeted T1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe2O4 Nanoparticles.

  • Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy.

  • High dose efficiency atomic resolution imaging via electron ptychography.

  • Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images.

  • Subsampled STEM-ptychography

  • Smart Align—a new tool for robust non-rigid registration of scanning microscope data

  • Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design

  • Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting

  • Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

  • More
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