Characterisation

Electron Microscopy and Microanalysis Facility

With its dedicated staff of research support scientists and technical support staff, the EM Facility supports and provides training on the core equipment, with the aim to help researchers obtain the highest possible quality data from the instruments.

Scanning Transmission Electron Microscopy Group

Developing advanced methods for the imaging and spectroscopy of materials at atomic resolution, primarily using the scanning transmission electron microscope (STEM), and applying those techniques to a wide range of functional materials.

Electron Image Analysis Group

Ultrahigh resolution electron microscopy, aberration correction and exit wave restoration. Developing new direct electron detectors and methods for diffractive imaging and phase retrieval.

Atom Probe Group

3D atom-by-atom imaging and chemical analysis of materials, instrumentation and the development of 3D reconstruction and data analysis techniques.

Surface Nanoscience Research Group

Atomic scale structure and properties of surfaces and nanostructures, and molecular ordering on surfaces, using two UHV scanning tunnelling microscopes (STM). Characterising and processing surfaces on the nanoscale to create new materials for applications in catalysis, gas sensing, microelectronics, and diverse areas of nanotechnology.

NanoSIMS Group

NanoSIMS provides ultra high resolution chemical imaging of features below 100nm in size and concentrations in the parts-per-million range. Investigations cover a wide range of metallic and polymeric and organic materials.


A wide range of characterisation techniques including SEM/TEM/STEM, FIB, FIM/3DAP, NanoSIMS, STM etc.

Lead Academic Staff: Paul Bagot, Harish BhaskaranPeter BruceMartin Castell, Nicole Grobert, Angus Kirkland, Michael Moody, Pete Nellist, Mauro Pasta, Jamie Warner

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