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 | Professor Angus KirklandProfessor of Materials |
[ Quicklinks: Research Summary Current Research Projects Recent Publications D.Phil. Projects Available ]
Summary of Research Interests
Ultra High Resolution Transmission Electron Microscopy. Image Simulation and Processing. The investigation of new approaches to quantitative microscopy (theory and experiment). Structural Studies of nanocrystals, inorganic oxides and surfaces. The development of new detectors for imaging with high energy electrons. Remote control of electron optical instruments.
Current Research Projects
Three-dimensional imaging and analysis through scanning confocal electron microscopy
Dr. P.D. Nellist, Professor A.I. Kirkland, E.C. Cosgriff, G. Behan, Professor L. Allen*
The department has installed the world’s first electron microscope with aberration correctors in both the condenser (probe-forming) and objective (image forming) lenses. It is possible to use both lens systems together to form a confocal microscope, which allows atomic resolution imaging and analysis in two dimensions simultaneous with nanometre-scale resolution in the third dimension. We are attempting to apply this technique to a diverse range of materials from buried interfaces in semiconductor devices to screw dislocation core structures. (* University of Melbourne, Australia)
Disorder in complex oxides
Dr. J.L. Hutchison, Professor A.I. Kirkland, Dr. J. Sloan*
Disorder in a variety of complex oxide structures which include layered bismuthates, non-stoichiometric rutiles and tungsten oxides is being investigated by high resolution techniques using the Oxford JEOL 4000EX and 3000F ultra-high resolution instruments. (*Advanced Technology Institute, University of Surrey)
Aberration-corrected electron microscopy for high resolution analysis and imaging
Professor D.J.H. Cockayne, Professor A.I. Kirkland, Dr. J.L. Hutchison, Dr. C.J.D. Hetherington, Dr. P.D. Nellist
As part of a major research grant, the Department has secured funding which enables us to work closely with an electron microscope manufacturer in developing the next generation of high performance electron microscopes. The new instrument includes a field-emission-gun, two aberration correctors and various advanced detectors which provide analysis and spatial resolution capabilities at the 1 angstrom level. The instrument is being used for atomic-scale investigations of a range of new materials. (Funded by the Joint Infrastructure Fund)
Tilt- and through-focus series image reconstruction techniques for super-reconstruction electron microscopy
Professor A.I. Kirkland
We are developing numerical techniques for reconstructing exit-waves from crystals to enable us to extract both the amplitudes and phases of diffracted beams. In this way the useable information in lattice imaging from the JEOL 3000F instrument can be extended out as far as 1 angstom. In the case of complex oxide structures the positions of the oxygen atoms are clearly revealed by this technique.
Remote Microscopy
Professor D.J.H. Cockayne, Professor P. Jeffreys*, M. Dovey*, Professor A.I. Kirkland, D. Hutton, Dr. M. Rahman
This project has developed a dedicated SEM for remote access over the WWW. It is being ""rolled out"" to schools from where it can be booked and operated on-line. Modules for use within the secondary school curricula have been developed and are being tested. In time, access will be given to museums and industry. (Funded by DTI and JEOL)
Experimental and theoretical electron energy loss studies of carbon nanostructures
Dr. R.J. Nicholls, Professor D.J.H. Cockayne, Professor A.I. Kirkland, Professor D.G. Pettifor, Professor G.A.D. Briggs
The local density of unoccupied electronic states is of vital importance in quantum nanotechnology. A combination of experimental electron energy loss spectroscopy and density functional and multiple scattering theories is an ideal way in which to study these states. We are using this combination of experiment and theory to probe the electronic structure of carbon nanomaterials. The aim is to better understand the interaction between a nanotube and endohedral fullerenes encapsulated inside it. (Partly funded by DSTL)
Quantitative Atomic resolution Imaging
Professor A.I. Kirkland
Almost all structural information derived from High Resolution Electron Microscopy relies on qualitative matching of observed and calculated image contrast. This project aims to investigate the fundamental reasons as to why the calculated and measured intensities differ by significant amounts and to develop quantitative approaches to image matching.
New Detectors for Transmission Electron Microscopy
Professor A.I. Kirkland, Dr. P.R. Wilshaw, Dr. C.J.D. Hetherington
Current generation imaging detectors for Transmission Electron Microscopy rely on a complex electron-photon conversion chain with the photons being detected by Charge Coupled Devices. As a result the overall sensitivity of these systems is poor and they are limited in their frame rate. We aim to construct the next generation of direct electron detector and this project will involve both computation and ultimately fabrication of a prototype device. (Funded by Leverhulme Trust)
Novel Approaches to Direct Object Reconstruction in Transmission Electron Microscopy
Professor A.I. Kirkland, Dr. C. Dwyer, Dr. L-Y. Chang
All Transmission Electron Microscope Images are resolution limited by the aberrations of the objective lens. This project aims to develop novel approaches to overcoming these limitations through direct reconstruction from combinations of imaging and diffraction experiments capable of achieving sub Angstrom resolution.
Aberration-corrected high resolution electron microscopy
Professor A.I. Kirkland, Dr. J.L. Hutchison,
We are exploring ways of adjusting spherical aberration in high resolution electron microscopy as a way of obtaining 0.1 nm resolution, and also as a way of controlling phase contrast, particularly in the study of nanocrystalline particles in the 1 - 2 nm size range.
Theory of Aberration Corrected Imaging
Professor A.I. Kirkland, Dr. L.Y. Chang
This project will investigate the theory of imaging under aberration corrected imaging conditions using the recently installed double Cs aberration corrected TEM in the Department.
Fundamentals of Aberration Corrected Imaging in the TEM
Professor A.I. Kirkland
The department has installed the world's first electron microscope with aberration correctors in both the condenser (probe-forming) and objective (image forming) lenses. This project aims to develop an understanding of the image contrast theory appropriate to this instrument, and to develop experimental techniques for exploiting variable aberration imaging. Possible materials candidates for experimental and theoretical studies include complex oxides and carbon nanotubes.
Structure and electronic properties of titanate materials using TEM and STM
H. Marsh, Dr. M.R. Castell, Professor A.I. Kirkland
Complex metal titanates exhibit a variety of unusual structural, surface and electronic properties. This project aims to carry out high resolution studies on a variety of doped titanate systems such as Nb doped SrTiO3 where we expect phase separation to occur at high dopant concentrations. By combining state of the art scanning probe and transmission electron microscopic techniques it will be possible to correlate electronic and structural properties of these materials with atomic scale resolution.
Understanding carbon nanotube growth
Dr. N. Grobert, Dr. L.Y. Chang, Professor A.I. Kirkland
Carbon nanotubes (CNTs) can be produced using different techniques, including carbon arc-discharge, laser ablation, electrolysis and chemical vapour deposition. Most of these techniques require metal catalyst particles. State-of-the-art electron microscopy techniques are used to investigate these metal particles and their role in CNT growth. (Supported by The Royal Society)
One-dimensional crystal growth inside single-wall carbon nanotubes
Professor A.I. Kirkland, Dr. J. Sloan*, Dr. J.L. Hutchison, Professor M.L.H. Green**
Crystals of various salts and metals grown within single-wall carbon nanotubes are effectively 1-D wires, with a range of interesting physical properties which arise from their unique configurations, We are exploring ways of growing these structures, which are characterised by HREM, EDX and EELS. Their physical properties are also under investigation. (*Advanced Technology Institute, University of Surrey; **Inorganic Chemistry Laboratory) (Funded by EPSRC, Leverhulme Trust and The Royal Society)
15 public active projects
Research Publications
Carter, R., Sloan, J., Kirkland, A.I., Meyer, R.R., Lindan, P.J.D., Lin, G., Green, M.L.H., Vlandas, A., Hutchison, J.L. and Harding, J. (2006). 'Correlation of structural and electronic properties in a new low-dimensional form of mercury telluride' Physical Review Letters 96(21).
Chang, L.Y., Kirkland, A.I. and Titchmarsh, J.M. (2006). 'On the importance of fifth-order spherical aberration for a fully corrected electron microscope' Ultramicroscopy 106(4-5) 301-306.
Doblinger, M., Winkelman, G.B., Dwyer, C., Marsh, C., Kirkland, A.I., Cockayne, D.J.H. and Hoffmann, M.J. (2006). 'Structural and compositional comparison of Si3N4 ceramics with different fracture modes' Acta Materialia 54(7) 1949-1956.
Flahaut, E., Sloan, J., Friedrichs, S., Kirkland, A.I., Coleman, K.S., Williams, V.C., Hanson, N., Hutchison, J.L. and Green, M.L.H. (2006). 'Crystallization of 2H and 4H PbI2 in carbon nanotubes of varying diameters and morphologies' Chemistry of Materials 18(8) 2059-2069.
Hetherington, C., Kirkland, A., Doole, R., Cockayne, D., Titchmarsh, J. and Hutchison, J. (2006). 'High resolution imaging using the Oxford abberation corrected TEM'. Microscopy and Microanalysis 11 1454-1455.
Lovely, G.R., Brown, A.P., Brydson, R., Kirkland, A.I., Meyer, R.R., Chang, L., Jefferson, D.A., Falke, M. and Bleloch, A. (2006). 'Observation of octahedral cation coordination on the 111 surfaces of iron oxide nanoparticles' Applied Physics Letters 88(9).
Lovely, G.R., Brown, A.P., Brydson, R., Kirkland, A.I., Meyer, R.R., Chang, L.Y., Jefferson, D.A., Falke, M. and Bleloch, A. (2006). 'HREM of the 111 surfaces of iron oxide nanoparticles' Micron 37(5) 389-395.
Marsh, H.L., Deak, D.S., Silly, F., Kirkland, A.I. and Castell, M.R. (2006). 'Hot STM of nanostructure dynamics on SrTiO3(001)' Nanotechnology 17(14) 3543-3548.
Nellist, P.D., Behan, G., Kirkland, A.I. and Hetherington, C.J.D. (2006). 'Confocal operation of a transmission electron microscope with two aberration correctors' Applied Physics Letters 89(12).
Pennycook, S.J., Varela, M., Hetherington, C.J.D. and Kirkland, A.I. (2006). 'Materials advances through aberration-corrected electron microscopy' Mrs Bulletin 31(1) 36-43.
Pyper, N.C., Kirkland, A.I. and Harding, J.H. (2006). 'Cohesion and polymorphism in solid rubidium chloride' Journal of Physics-Condensed Matter 18(2) 683-702.
Sloan, J., Carter, R., Kirkland, A.I., Meyer, R.R., Vlandas, A., Green, M.L.H. and Hutchison, J.L. (2006). 'Image restoration of one-dimensional HgTe crystals formed within single walled carbon nanotubes'. "Advanced Materials Forum Iii, Pts 1 and 2". 514-516 1131-1134.
Friedrichs, S., Kirkland, A.I., Meyer, R.R., Sloan, J. and Green, M.L.H. (2005). 'LaI2@(18,3)SWNT: The unprecedented structure of a LaI2 "Crystal," encapsulated within a single-walled carbon nanotube' Microscopy and Microanalysis 11(5) 421-430.
Hetherington, C.J.D., Cockayne, D.J.H., Doole, R.C., Hutchison, J.L., Kirkland, A.I. and Titchmarsh, J.M. (2005). 'Aberration-corrected HREM/STEM for semiconductor research'. "Microscopy of Semiconducting Materials". Cullis, A.G.,Hutchison, J.L. 107 177-182.
Kirkland, A.I., Meyer, M.R., Sloan, J. and Hutchison, J.L. (2005). 'Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes' Microscopy and Microanalysis 11(5) 401-409.
Chang, L.Y., Meyer, R.R. and Kirkland, A.I.: 'Calculations of HREM image intensity using Monte Carlo integration' Ultramicroscopy 104 (3-4) (2005) 271-280.
Chang, L.Y., Meyer, R.R. and Kirkland, A.I.: 'Calculations of HREM image intensity using monte carlo integration' Microscopy And Microanalysis 11 (2005) 600.
Dunin-Borkowski, R.E., Kasama, T., Cervera, L., Twitchett, A.C., Midgley, P.A., Robins, A.C., Smith, D.W., Gronsky, J.J., Thomas, C.M., Fischione, P.E., Hetherington, C.J.D. and Kirkland, A.I.: 'Aberration correction: some advantages and alternatives' Microscopy And Microanalysis 10 (2005) 22.
Hutchison, J.L., Titchmarsh, J.M., Cockayne, D.J.H., Doole, R.C., Hetherington, C.J.D., Kirkland, A.I. and Sawada, H.: 'A versatile double aberration-corrected, energy filtered HREM/STEM for materials science' Ultramicroscopy 103 (1) (2005) 7-15.
Hutchison, J.L., Titchmarsh, J.M., Cockayne, D.J.H., Hetherington, C.J.D., Kirkland, A.I., Doole, R.C. and Sawada, H.: 'A new double-corrected HREM/STEM and its applications for advanced materials' Microscopy And Microanalysis 10 (2005) 8.
Kirkland, A.I. and Chang, L.Y.: 'An assessment of imaging models for exit wave restoration' Microscopy And Microanalysis 11 (2005) 2152.
Sawada, H., Tomita, T., Naruse, M., Honda, T., Hambridge, P., Hartel, P., Haider, M., Hetherington, C., Doole, R., Kirkland, A., Hutchison, J., Titchmarsh, J. and Cockayne, D.: 'Experimental evaluation of a spherical aberration-corrected TEM and STEM' Journal Of Electron Microscopy 54 (2) (2005) 119-121.
Sloan, J., Kirkland, A.I., Carter, R., Meyer, R.R., Vlandas, A. and Hutchison, J.L.: 'Image restoration of one-dimensional HgTe crystals formed within walled carbon nanotubes' Microscopy And Microanalysis 11 198.
Friedrichs, S., Sloan, J., Meyer, R.R., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H.: 'Characterisation of LaI2@(18 3)SWNT Encapsulation Composite - A 1D LaI2 Crystal fragment adopting the reduced structrue of LaI3' Microscopy And Microanalysis 9 (2004) 324.
Sloan, J., Langley, K.L., Day, E.V., Meyer, R.R. and Kirkland, A.I. (2004). Studies of variations in insertion cations in Intergrowth Tungsten Bronzes (ITBs). Electron Microscopy And Analysis 2003: 71-74.
Sloan, J., Langley, K.L., Kirkland, A.I., Meyer, R.R., Sayagues, M.J., Tilley, R.J.D. and Hutchison, J.L. (2004). Structural studies of a modulated quaternary layered perovskite. Electron Microscopy And Analysis 2003: 229-232.
Sloan, J., Luzzi, D.E., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H.: 'Imaging and characterization of molecules and one-dimensional crystals formed within carbon nanotubes.' Mrs Bulletin 29 (4) (2004) 265-271.
Thamavaranukup, N., Hoppe, H.A., Ruiz-Gonzalez, L., Costa, P., Sloan, J., Kirkland, A. and Green, M.L.H.: 'Single-walled carbon nanotubes filled with M OH (M = K, Cs) and then washed and refilled with clusters and molecules.' Chemical Communications (15) (2004) 1686-1687.
Titchmarsh, J.M., Cockayne, D.J.H., Doole, R.C., Hetherington, C.J.D., Hutchison, J.L., Kirkland, A.I. and Sawada, H. (2004). A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 27.
Vlandas, A., Carter, R., Sorsa, S., Flahaut, E., Sloan, J., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H. (2004). Encapsulation of semiconductors in double wall carbon nanotubes. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 345.
Carter, R., Sloan, J., Kirkland, A.I., Meyer, R.R., Hutchison, J.L. and Green, M.L.H. (2004). A one-dimensional semiconductor crystal with differentially rotating atomic layers formed within a single-walled carbon nanotube. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 351.
Chang, L.Y., Meyer, R.R. and Kirkland, A.I. (2004). Calculations of limited coherence for high resolution electron microscopy. Electron Microscopy And Analysis 2003: 345-348.
Chang, L.Y., Meyer, R.R. and Kirkland, A.I. (2004). Models of coherence for High Resolution Electron Microscopy. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 435.
Doblinger, M., Cockayne, D.J.H., Meyer, R.R., Kirkland, A.I. and Nguyen-Manh, D. (2004). Induced order in intergranular films in Si3N4 ceramics. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 59.
Friedrichs, S., Kirkland, A.I. and Green, M.L.H. (2004). Combined characterisation of the structural and physical properties of single walled cardbon nanotube composites. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 317.
Friedrichs, S., Philp, E., Meyer, R.R., Sloan, J., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H. (2004). LaI2@(18,3)SWNT: the crystallisation behaviour of a LaI2 fragment, confined within a single-walled carbon nanotube. Electron Microscopy And Analysis 2003: 455-458.
Hsieh, W.K., Chen, F.R., Kai, J.J. and Kirkland, A.I.: 'Resolution extension and exit wave reconstruction in complex HREM.' Ultramicroscopy 98 (2-4) (2004) 99-114.
Hsieh, W.K., Chen, F.R., Kai, J.J. and Kirkland, A.I. (2004). Resolution extrension and exit wave reconstruction in complex HREM. APEM, Japan Society for Microscopy.
Hutchison, J.L., Allsop, N., Kirkland, A.I., Hetherington, C.J.D., Titchmarsh, J.M., Cockayne, D.J.H. and Dobson, P.J. (2004). Optimisd HREM imaging of CdSe nanoparticles. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 93.
Hutchison, J.L., Kirkland, A.I., Sloan, J. and Green, M.L.H. (2004). Growing 1D crystals inside carbon nanotubes: new nanostructures from old materials. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 93.
Hutchison, J.L., Sloan, J., Kirkland, A.I., Green, M.L.H. and Green, M.L.H.: 'Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes.' Journal Of Electron Microscopy 53 (2) (2004) 101-106.
Kirkland, A.I. and Meyer, R.R. (2004). Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction. Electron Microscopy And Analysis 2003: 331-336.
Kirkland, A.I. and Meyer, R.R.: '"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction.' Microscopy And Microanalysis 10 (4) (2004) 401-413.
Kirkland, A.I., Meyer, R.R., Cockayne, D.J.H., Hetherington, C.J.D., Hutchison, J.L. and Titchmarsh, J.M. (2004). Exit wave reconstruction using an energy filtered aberration corrected TEM. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 49.
Kirkland, A.I., Titchmarsh, J.M., Hutchison, J.L., Cockayne, D.J.H., Hetherington, C.J.D., Doole, R.C., Sawada, H., Haider, M. and Hartel, P.: 'A double aberration corrected, energy filtered HREM/STEM.' Jeol News 39 (1) (2004) 2.
Meyer, R.R. and Kirkland, A.I. (2004). Automated Object Wave Restoration from Combined Tilt Focus Series. APEM, Japan Society for Microscopy.
Meyer, R.R. and Kirkland, A.I. (2004). Measuring isoplanaticity in high-resolution electron microscopy. Electron Microscopy And Analysis 2003: 199-202.
Meyer, R.R., Kirkland, A.I., Dovey, M., Cockayne, D.J.H. and Jeffreys, P. (2004). Remote microscopy using the grid. Electron Microscopy And Analysis 2003: 173-176.
Meyer, R.R., Kirkland, A.I. and Saxton, W.O.: 'A new method for the determination of the wave aberration function for high-resolution TEM. 2. Measurement of the antisymmetric aberrations.' Ultramicroscopy 99 (2-3) (2004) 115-123.
Sawada, H., Tomita, T., Kaneyama, T., Hosokawa, F., Naruse, M., Honda, T., Hartel, P., Haider, M., Tanaka, N., Hetherington, C.J.D., Doole, R.C., Kirkland, A.I., Hutchison, J.L., Titchmarsh, J.M. and Cockayne, D.J.H.: 'Cs corrector for illumination.' Microscopy and Microanalysis 10 (Suppl 2) (2004) 976.
Titchmarsh, J.M. and Cockayne, D.J.H. (2004). 200kV TEM with Cs correctors for illumination and imaging. APEM, Japan Society for Microscopy.
Sloan, J., Carter, R., Philp, E., Kirkland, A.I., Meyer, R.R., Hutchison, J.L. and Green, M.L.H. (2004). Super-resolved imaging of twisted 1D crystals formed within single walled carbon nanotubes. Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium. 2: 321.
Sloan, J., Kirkland, A.I., Hutchison, J.L., Friedrichs, S. and Green, M.L.H. (2004). Synthesis and Structural Characterisation of Single Wall Carbon Nanotubes Filled with Ionic and Covalent Materials. Molecular Nanowires and other Quantum Objects. Alexandrov, A.S., Kluwer Academic Publishers: 77-88.
Alexandrou I., Sano N., Burrows A., Meyer R.R., Wang H., Kirkland A.I., Kiely C.J. and Amaratunga G.A.J.: 'Structural investigation of MoSi2 core-shell nano-particles pormed by arc discharge in water' Nanotechnology 14, 913 (2003).
Meyer R.R. and Kirkland A.I.: 'Characterisation of the signal and noise transfer of CCD cameras for electron detection' SPIE Press, (2003), p. 184-196.
Sayagues M., Titmuss K., Meyer R., Kirkland A., Sloan J., Hutchison J. and Tilley R.: 'Structural characterization of the n=5 layered perovskite neodymium titanate using high-resolution transmission electron microscopy and image reconstruction' Acta Crystallographica Section B- Structural Science 59, 449-455 (2003).
Chang, L.Y., Chen, F.R., Kirkland, A.I. and Kai, J.J.: 'Calculations of spherical aberration-corrected imaging behaviour.' Journal Of Electron Microscopy 52 (4) (2003) 359-364.
Chen, F.R., Chang, L.Y. and Kirkland, A.I.: 'Calculations of spherical aberration-corrected imaging behaviour.' Journal Of Electron Microscopy 52 (359) (2003)
Meyer, R.R., Friedrichs, S., Kirkland, A.I., Sloan, J., Hutchison, J.L. and Green, M.L.H.: 'A composite method for the determination of the chirality of single walled carbon nanotubes.' Journal Of Microscopy-Oxford 212 (2003) 152-157.
Philp, E., Sloan, J., Kirkland, A.I., Meyer, R.R., Friedrichs, S., Hutchison, J.L. and Green, M.L.H.: 'An encapsulated helical one-dimensional cobalt iodide nanostructure.' Nature Materials 2 (12) (2003) 788-791.
Sloan, J., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H.: 'Aspects of crystal growth within carbon nanotubes.' Comptes Rendus Physique 4 (9) (2003) 1063-1074.
Sloan, J., Kirkland, A.I., Hutchison, J.L. and Green, M.L.H. (2003). Integral Atomic Layer Architectures of 1D Crystals Inserted into Single Walled Carbon Nanotubes. Electron MIcroscopy of Nanotubes. Wang, Z.L. and Hui, C., Kluwer Press. Ch 12: 273-300.
Kirkland A.I. and Sloan J.: 'Direct and indirect electron microscopy of encapsulated nanocrystals' Topics in Catalysis 21, 139-154 (2002).
Sloan J., Kirkland A.I., Hutchison J.L. and Green M.L.H.: 'Structural characterization of atomically regulated nanocrystals formed within single-walled carbon nanotubes using electron microscopy' Accounts of Chemical Research 35, 1054-1062 (2002).
Projects Available
Ultimate microscopy without lenses
A Kirkland
All Transmission Electron Microscope Images are resolution limited by the aberrations of the objective lens. This project aims to develop radical new approaches to overcoming these limitations by processing diffraction data thus avoiding the need for a good (or even any) lens. The approaches developed will form part of a multi University program investigating imaging and diffraction using a variety of radiation sources.
Also see homepages:Angus Kirkland
Studies of metal nanocrystals on Strontuim Titanate
M R Castell / A I Kirkland
It is possible to grow a variety of metal nanocrystals on clean single crystal strontium titanate surfaces. Such particles often adopt novel morphologies which can be controlled and which may provide novel catalysts and gas sensors. For example, silver nanocrystals with fivefold symmetry have been observed, and palladium crystals have been shown to change their shape depending on the detailed atomic structure of the substrate. This project aims to characterize these materials with atomic resolution, using both scanning tunnelling microscopy (STM) and transmission electron microscopy (TEM) in an attempt to understand their growth and structure.
Also see homepages:Martin Castell Angus Kirkland
New detectors for transmission electron microscopy
A Kirkland / P R Wilshaw / G. Moldovan
Current generation imaging detectors for Transmission Electron Microscopy rely on a complex electron-photon conversion chain with the photons being detected by Charge Coupled Devices. As a result the overall sensitivity of these systems is poor and they are limited in their frame rate. We aim to construct the next generation of direct electron detector and this project will involve both simulation and fabrication of prototype devices.
Also see homepages:Angus Kirkland Peter Wilshaw
Charge sensitive imaging
A Kirkland
“If one knew the positions of all the electrons in a material, there would be no need to find where the nuclei are”. Traditional electron microscopy determines the nuclei positions and we are now aiming to develop methods for locating the electrons. This will revolutionise the study of almost all materials and will provide a new level of structural information for comparison with theoretical models. This project will aim to establish new methods using oxides as test materials by combing TEM and STM studies together with advanced image simulation. The project will form part of a major collaboration between Oxford and Northwestern University in Chicago with extensive opportunities for travel between the two.
Also see homepages:Angus Kirkland
Imaging bonding through inelastic electron scattering in the electron microscope
P Nellist / R J Nicholls / J Yates
Inelastic electron scattering provides a wealth of information about bonding in materials and is the basis of electron energy-loss spectroscopy. Under certain imaging conditions, the partial coherence of the scattering process may reveal information about the symmetry of the bonding states in materials. The aim of this theory project is to develop quantum mechanical models of the inelastic scattering process to guide the development of experiments to measure this information.
Also see homepages:Angus Kirkland Peter Nellist Jonathan Yates
Three-dimensional characterisation of materials using scanning confocal electron microscopy
P D Nellist / A Kirkland
Using the unique electron microscope fitted with two aberration correctors installed in the Department we have developed an entirely new mode of electron microscopy: aberration-corrected scanning confocal electron microscopy. This new mode offers a unique opportunity to perform three-dimensional imaging and spectroscopy on materials. Research in this topic can range from the development of advanced microscope control and data analysis techniques to the application of the technique to applications such mapping diseased cells, investigating the formation of precipitates and non-planar semiconductor device structures.
Also see homepages:Angus Kirkland Peter Nellist
Ultra high resolution imaging of soft (biological) materials
A Kirkland
This project aims to extend many of the ultra high resolution imaging techniques that have been develop for imaging hard (radiation resistant) materials to soft materials including biological structures. This is an entirely new area and projects will be available in experimental, theoretical and computational areas or combinations of these. Part of this work may involve collaboration with University College Davis in the USA and with the MRC laboratories in Oxford.
Also see homepages:Angus Kirkland
Nanocrystalline metal and metal oxide catalysts
A Kirkland
Nanocrystalline metal and metal oxide particles play a key role in catalysis. This project aims to characterize these materials, and in particular their surfaces and shapes using combinations of high resolution imaging and three dimensional tomographic reconstruction. The project will also involve interactions with theoretical modelling groups in Australia and for suitable systems prototype catalytic studies. Within this project there may be opportunities for an extended work period in Australia.
Also see homepages:Angus Kirkland
Quantitative atomic resolution imaging
A Kirkland
Almost all structural information derived from High Resolution Electron Microscopy relies on qualitative matching of observed and calculated images. This project aims to investigate the fundamental reasons as to why the calculated and measured image contrast differs by significant amounts and to develop new quantitative approaches to image matching that can be applied to a range of structural problems.
Also see homepages:Angus Kirkland
Image reconstruction techniques for super-reconstruction electron microscopy
A Kirkland
We are developing techniques for reconstructing the exit wavefunction of various specimens from images recorded with different focus values or with different illumination tilts. In this way it is possible to obtain fully quantitative structural data at higher resolution than the instrinsic limit set by the optics of the electron microscope. This project will apply this approach to a variety of nanomaterials with the aim of understanding their structure property relationships at higher spatial resolution than is otherwise possible.
Also see homepages:Angus Kirkland
Applications of aberration-corrected high resolution electron microscopy
A Kirkland
The department has installed one of the world’s only electron microscopes with aberration correctors in both the condenser (probe-forming) and objective (image forming) lenses. This instrument is capable of recording images with 70pm resolution. Several projects are available that will develop experimental, theoretical and computational techniques for exploiting aberration corrected imaging. Possible materials candidates for experimental and theoretical studies include complex oxide ceramics, surfaces, nanocatalysts and carbon nanotubes.
Also see homepages:Angus Kirkland
High performance remote instrument control and visualisation
A Kirkland
As part of a collaboration between the Oxford e-research centre, the University of San Diego and Microsoft we are investigating the application of Grid based networking and distributed computing for remote control of high performance instruments. This project will aim to develop applications using the latest high performance optical networks to develop “collaboratories” through which instruments and data can be remotely shared by multiple users. For this project it is anticipated that there will be periods of time spent working with staff in the OeRC and in San Diego.
Also see homepages:Angus Kirkland
Also see a full listing of New projects available within the Department of Materials.
