Phase reconstruction using fast binary 4D STEM data
Peter Nellist: List of publications
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials.
Targeted T1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe2O4 Nanoparticles.
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy.
High dose efficiency atomic resolution imaging via electron ptychography.
Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography.
Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM.
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images.
4D Analytical STEM with the pnCCD
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field.
Ideal versus real: simulated annealing of experimentally derived and geometric platinum nanoparticles.
Observation of metal nanoparticles at atomic resolution in Pt-based cancer chemotherapeutics.
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy.
Managing dose-, damage- and data-rates in multi-frame spectrum-imaging.
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution.
Excited helium under high pressures in the bulk and in nanobubbles
Using Advanced STEM Techniques to Unravel Key Issues in the Development of Next-Generation Nanostructures for Energy Storage
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping.
Electron ptychographic microscopy for three-dimensional imaging.
Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory.
Electron-optical sectioning for three-dimensional imaging of crystal defect structures
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities.
Hybrid statistics-simulations based method for atom-counting from ADF STEM images.
3D elemental mapping with nanometer scale depth resolution via electron optical sectioning.
Direct visualization of electrical transport-induced alloy formation and composition changes in filled multi-wall carbon nanotubes by in situ scanning transmission electron microscopy
Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope.
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures.
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM
Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy.
Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach.
Compositional quantification of PtCo acid-leached fuel cell catalysts using EDX partial cross sections
Quantitative STEM normalisation: The importance of the electron flux.
Smart Align—a new tool for robust non-rigid registration of scanning microscope data
4D STEM: High efficiency phase contrast imaging using a fast pixelated detector
Quantification of a heterogeneous ruthenium catalyst on carbon-black using ADF imaging
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?
Optimal ADF STEM imaging parameters for tilt-robust image quantification.
Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning.
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution.
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditions.
Morphology--composition correlations in carbon nanotubes synthesised with nitrogen and phosphorus containing precursors.
Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy.
Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy.
WS₂ 2D nanosheets in 3D nanoflowers.
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride.
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride
Direct Observation of depth-dependent atomic displacements associated with dislocations in gallium nitride
Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science
Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM
Maximum Efficiency STEM Phase Contrast Imaging
Optical Sectioning with Atomic Resolution Spectroscopy
Probing Atomic Scale Dynamics with STEM
STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
Testing the accuracy of the two-dimensional object model in HAADF STEM.
Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting
Crystal structure of the ZrO phase at zirconium/zirconium oxide interfaces
The development of a 200 kV monochromated field emission electron source.
Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope
Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
Unusual stacking variations in liquid-phase exfoliated transition metal dichalcogenides.
A dissociation mechanism for the [a+c] dislocation in GaN
Characterisation of defects at non-polar GaN/InGaN junctions in novel materials for application in light emitting diodes
How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification
Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM
Structural quantification of nanoparticles by HAADF STEM
Testing the accuracy of the two-dimensional object model in HAADF STEM
The addition of aluminium and manganese to ruthenium liner layers for use as a copper diffusion barrier
Two-dimensional object functions and three-dimensional illumination functions: Their validity, interaction and utility
Contrast in atomically resolved EF-SCEM imaging
Contrast in atomically resolved EF-SCEM imaging.
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
The dissociation of the [a + c] dislocation in GaN
Probing the bonding in nitrogen-doped graphene using electron energy loss spectroscopy.
Identifying and correcting scan noise and drift in the scanning transmission electron microscope.
Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets.
Scanning transmission electron microscopy investigations of self-forming diffusion barrier formation in Cu(Mn) alloys on SiO2
The dissociation of the [ a + c ] dislocation in GaN
Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
Chemical and structural investigations of the incorporation of metal manganese into ruthenium thin films for use as copper diffusion barrier layers
Single-step exfoliation and chemical functionalisation of graphene and hBN nanosheets with nickel phthalocyanine
Self-assembly of LiMo3Se3 nanowire networks from nanoscale building-blocks in solution.
Growth characteristics of Mn silicate barrier layers on SiO 2
Boron-mediated nanotube morphologies.
Chemical and structural investigations of the interactions of Cu with MnSiO 3 diffusion barrier layers
Nanohalos: a manifestation of electron channelling in gold nanoparticles.
ELECTRON MICROSCOPY Atomic resolution comes into phase
Optical sectioning and confocal imaging and analysis in the transmission electron microscope
Atomic resolution imaging of 2D nanomaterials
Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Effect Of The Eshelby-Stroh Twist In Dislocations In GaN Imaged End-On
Energy-Filtered Scanning Confocal Electron Microscopy
Focal Series Reconstruction in Annular Dark-Field STEM
Post-processing of STEM Data for Instability and Drift Compensation
STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry
Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy.
Three-dimensional elemental mapping of hollow Fe 2O 3@SiO 2 mesoporous spheres using scanning confocal electron microscopy
(S)TEM analysis of the interdiffusion and barrier layer formation in Mn/Cu heterostructures on SiO 2 for interconnect technologies
A non-syn-gas catalytic route to methanol production.
Chromatic confocal electron microscopy with a finite pinhole size
Imaging and diffraction characterisation of 2D inorganic nanostructures
Low-loss EELS of 2D boron nitride
On the visibility of "heavy" atoms in dark-field STEM
Quantitative analysis of core-shell catalyst nanoparticles for industrial applications
Quantitative techniques for aberration corrected HAADF STEM of nano-materials
STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension
Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM)
Chemical and structural investigation of the role of both Mn and Mn oxide in the formation of manganese silicate barrier layers on SiO2
Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
Interdiffusion and barrier layer formation in thermally evaporated Mn/Cu heterostructures on SiO2 substrates
Two-dimensional nanosheets produced by liquid exfoliation of layered materials.
Effect of Eshelby twist on core structure of screw dislocations in molybdenum: atomic structure and electron microscope image simulations
A facile route to self-assembled Hg//MoSI nanowire networks
Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapods.
Aberration measurement using the Ronchigram contrast transfer function.
Filled and glycosylated carbon nanotubes for in vivo radioemitter localization and imaging.
Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
Dependence of surface facet period on the diameter of nanowires.
Processing and characterisation of Mo6S2I8 nanowires.
A facile route to self-assembled Hg//MoSI nanowire networks
Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
ADF STEM imaging of screw dislocations viewed end-on
Applications of the Oxford-JEOL aberration-corrected electron microscope
Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope
Image contrast in aberration-corrected scanning confocal electron microscopy
Imaging and Analysis of Axial Heterostructured Silicon Nanowires
Towards quantitative analysis of core-shell catalyst nanoparticles by aberration corrected high angle annular dark field STEM and EDX
New possibilities with aberration-corrected electron microscopy.
Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Doping-dependent nanofaceting on silicon nanowire surfaces
The mechanical properties of tungsten grown by chemical vapour deposition
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
Evidence of high-pressure rhodium sesquioxide in the rhodium/γ- alumina catalytic system
Simulating Atomic Resolution STEM Images of Non-Periodic Samples
Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
High-resolution TEM and the application of direct and indirect aberration correction
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
From nanocrystals to nanorods: New iron oxide-silica nanocomposites from metallorganic precursors
Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Depth sectioning using electron energy loss spectroscopy
Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes
Theoretical interpretation of electron energy-loss spectroscopic images
Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
Atomic-scale detection of organic molecules coupled to single-walled carbon nanotubes.
A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
Observation of van der Waals Driven Self-Assembly of MoSI Nanowires into a Low-Symmetry Structure Using Aberration-Corrected Electron Microscopy
Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
Confocal operation of a transmission electron microscope with two aberration correctors
Mo6S4.5I4.5Nanowires: Structure Studies by HRTEM and Aberration Corrected STEM
Aberration-corrected STEM: current performance and future directions
Quantification of ADF STEM images of molybdenum chalcogenide nanowires
An Aberration-Corrected STEM for Diffraction Studies.
Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.
Materials analysis by aberration-corrected STEM
Direct sub-angstrom imaging of a crystal lattice
Aberration-corrected charged-particle optical apparatus
Spectroscopic imaging of single atoms within a bulk solid.
HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
Towards sub-0.5 angstrom beams through aberration corrected STEM
Towards sub-0.5 A electron beams.
Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy
Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra
Nanoscale structure/property correlation through aberration-corrected stem and theory
Transmission electron microscopy: Overview and challenges
Dialkyl sulfides: Novel passivating agents for gold nanoparticles
Developments in C-s-corrected STEM
On the origin of transverse incoherence in Z-contrast STEM.
Progress in aberration-corrected scanning transmission electron microscopy.
Scanning transmission electron microscopy studies of the deposition of size-selected sub-nanometre platinum clusters
TEM investigations of industrial platinum on graphite catalyst systems: Image processing and particle morphology
Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
Direct electron beam writing of nanostructures using passivated gold clusters
Shallow implantation of "Size-Selected" Ag clusters into graphite
Orientational and translational ordering of sub-monolayer films of passivated multiply-twinned gold clusters
The principles and interpretation of annular dark-field Z-contrast imaging
Limitations of the dipole approximation in calculations for the scanning transmission electron microscope
Incoherent imaging using dynamically scattered coherent electrons
A combined experimental and theoretical approach to atomic structure and segregation at ceramic interfaces
HRTEM studies of the aggregation of size-selected Ag clusters deposited onto graphite
Subangstrom resolution imaging using annular dark-field STEM
Z-contrast scanning transmission electron microscopy
Atomistic structure of misfit dislocations in SrZrO3/SrTiO3 interfaces
Subangstrom resolution by underfocused incoherent transmission electron microscopy
Investigation of the evolution of single domain, (111) B CdTe films by molecular beam epitaxy on miscut (001) Si substrate
Direct observation of the core structures of threading dislocations in GaN
Accurate structure determination from image reconstruction in ADF STEM
Three-dimensional atomic structure of NiO-ZrO2(cubic) interfaces
The atomic origins of reduced critical currents at  tilt grain boundaries in YBa2Cu3O7-delta thin films
Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
Direct observations of defect structures in optoelectronic materials by Z-contrast stem
Electron ptychography. I. Experimental demonstration beyond the conventional resolution limits
Investigating the atomic scale superconducting properties of grain boundaries in high-Tc superconductors
Quantitative sub-angstrom imaging through ADF STEM
EELS in the STEM: Determination of materials properties on the atomic scale
Atomic layer graphoepitaxy for single crystal heterostructures
Atomic structure of a 36.8 (210) tilt grain boundary in TiO2
Atomic resolution Z-contrast imaging of ultradispersed catalysts
Combined-techniques approach to elucidating crystalline interface atomic structure
Determination of atomic structure at surfaces and interfaces by high-resolution stem
Direct structure determination by atomic-resolution incoherent STEM imaging
Structure and bonding at Ni-ZrO2 (cubic) interfaces formed by the reduction of a NiO-ZrO2 (cubic) composite
Analysis of nanometre-sized pyrogenic particles in the scanning transmission electron microscope
Direct imaging of the atomic configuration of ultradispersed catalysts
High angle dark field STEM for advanced materials
RESOLUTION BEYOND THE INFORMATION LIMIT IN TRANSMISSION ELECTRON-MICROSCOPY
Microanalysis at the atomic level
BEYOND THE CONVENTIONAL INFORMATION LIMIT - THE RELEVANT COHERENCE FUNCTION
Direct measurement of the effective source coherence in STEM
STEM imaging of tetrahedral semiconductors
EXPERIMENTAL TESTS ON DOUBLE-RESOLUTION COHERENT IMAGING VIA STEM
IMAGE-RESOLUTION IMPROVEMENT USING COHERENT MICRODIFFRACTION IN STEM