Smart Align-a new tool for robust non-rigid registration of scanning microscope data

Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD

2015

Journal article

Journal:

ADVANCED STRUCTURAL AND CHEMICAL IMAGING

Volume:

No abstract available

Keywords:

Image registration

Non-rigid registration

Quantitative ADF

Strain mapping

Principle component analysis

Scanning tunnelling microscopy (STM)

DOI