Atom probe crystallography: Atomic-scale 3-D orientation mapping

Araullo-Peters VJ, Gault B, Shrestha SL, Yao L, Moody MP, Ringer SP, Cairney JM
No abstract available
Keywords:

Atom probe tomography

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Nanostructure

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Nanocrystalline materials

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Texture

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Orientation imaging microscopy (OIM)