Achieving High-Resolution Ptychographic Phase for Radiation-Sensitive Materials Using Multi-Frame/Multi-Pass Approach

Mostaed A, Liberti E, Huang C, Moshtaghpour A, Kirkland A

24 July 2024

Journal article

Journal:

Microscopy and Microanalysis

Volume:

Issue:

Supplement_1

Oxford University Press (OUP)

ozae044.941

No abstract available

Keywords:

40 Engineering

4016 Materials Engineering

DOI