Extending the Limits of Fast Acquisition in TEM Tomography and 4D‐STEM

Simson M, Dunin-Borkowski RE, Hartmann R, Huth M, Ihle S, Jones L, Kondo Y, Migunov V, Nellist PD, Ritz R, Ryll H, Sagawa R

et al

Chapter

Book Title:

European Microscopy Congress 2016: Proceedings

Wiley

pp.

51 - 52

No abstract available

Keywords:

51 Physical Sciences

5104 Condensed Matter Physics

Bioengineering

DOI