A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy

Nicholls D, Wells J, Robinson AW, Moshtaghpour A, Kobylynska M, Fleck RA, Kirkland AI, Browning ND

10 June 2023

Conference paper

Volume:

Institute of Electrical and Electronics Engineers (IEEE)

pp.

1 - 5

No abstract available

Keywords:

46 Information and Computing Sciences

51 Physical Sciences

4603 Computer Vision and Multimedia Computation

Bioengineering

DOI