Modelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces

 
Schematic of insulator semiconductor

In this work we report a theoretical model to interpret Kelvin probe surface voltage and photovoltage measurements including four critical mechanisms;

-  charge stored in interface surface states;

-  charge in different locations of a surface thin film;

-  changes to effective lifetime and excess carrier density; and 

-  the non-uniformity of charge.

 

Read the full paper in Materials Research Express.