Modelling of Kelvin probe surface voltage and photovoltage in dielectric-semiconductor interfaces
In this work we report a theoretical model to interpret Kelvin probe surface voltage and photovoltage measurements including four critical mechanisms;
- charge stored in interface surface states;
- charge in different locations of a surface thin film;
- changes to effective lifetime and excess carrier density; and
- the non-uniformity of charge.
Read the full paper in Materials Research Express.