Effect of Eshelby twist on core structure of screw dislocations in molybdenum: Atomic structure and electron microscope image simulations. R. Groger, K.J. Dudeck, P.D. Nellist, V. Vitek, P.B. Hirsch and D.J.H. Cockayne, Phil. Mag. 91, 2364 (2011)
ADF STEM imaging of screw dislocations viewed end-on. E.C. Cosgriff, P.D. Nellist, P.B. Hirsch, Z. Zhou and D.J.H. Cockayne, Phil. Mag. 90, 4361 (2010).
Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy. P.D. Nellist, E.C. Cosgriff, P.B. Hirsch and D.J.H. Cockayne, Microscopy & Microanalysis, 14, 92 (2008).
Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes. P.D. Nellist, E.C. Cosgriff, P.B. Hirsch and D.J.H. Cockayne, Phil. Mag. 88, 135 (2008).
50 Years of TEM of Dislocations: Past, Present and Future. P.B. Hirsch, D.J.H. Cockayne, J.C.H. Spence and M.J. Whelan, Phil. Mag. Special Issue, 86, 4519 (2006).
Modelling the upper yield point and the brittle-ductile transition of silicon wafers in three-point bend tests. S.G. Roberts and P.B. Hirsch, Phil. Mag. 86, 4099 (2006).