Crystalline silicon solar cells are the main products in photovoltaic power generation. Current-voltage (I-V) measurement is crucial for their quality control, efficiency optimization, and classification in production. Manufacturers usually utilize fewer probe bars to acquire the I-V characteristic of super multi-busbar (SMBB) solar cells. However, this approach can introduce unexpected errors, particularly when modifications such as reducing the number of fingers or adjusting finger line resistance are made to minimize silver consumption. In this study, we analyze the sources of measurement deviations caused by using fewer probe bars for SMBB solar cells, subsequently propose a linear correction method to directly determine and compensate for the difference between the true and measured series resistance. This method is independent of finger line resistance and finger number, two primary factors influenced by silver usage reduction. Furthermore, we outline the experimental setup used to extract the coefficients of the linear function and validate our approach through experimental simulations. Our methodology only requires an algorithm upgrade in existing I-V measurement systems, enabling valid measurements with fewer probe bars regardless of any change in metallization and other cell parameters. This advancement significantly reduces production metrology costs while maintaining measurement accuracy, as well as to be applied to charactering busbarless solar cells.
40 Engineering
,4009 Electronics, Sensors and Digital Hardware
