LECO-treated TOPCon solar cells: failure mode affecting reliability

Laser Enhanced Contact Optimisation (LECO) is a widely adopted technique for improving the metal-semiconductor interface in silicon solar cells.

In this paper* published in Solar RRL, the authors found that reverse and forward bias stress at high temperatures significantly degrade the p⁺-Ag contact, leading to increased series resistance and deteriorated current-voltage characteristics, ultimately compromising cell reliability.  

These findings suggest that while LECO improve performance, more research is needed to understand and prevent long-term reliability issues.

This paper has additionally been featured in PV Magazine - an international leading media outlet dedicated to comprehensive coverage of the solar energy industry.

*'A failure mode affecting the reliability of LECO-treated high-efficiency TOPCon solar cells'.