Peter Wilshaw

© 2011-2012 IEEE. This paper presents techniques to tailor and optimize the field-effect passivation of silicon surfaces using the deposition and field-Assisted migration of potassium ions. While field-effect passivation of this nature has previously been demonstrated using laboratory scale techniques, in this paper, it is shown how it can be realized using fast and scalable ion deposition and migration methods. Together, the deposition and migration processes are seen to produce excellent improvements to the surface passivation of oxidized 1-Ω·cm n-Type float-zone silicon. Effective lifetimes as high as 2.1 ms are observed, in the best case yielding a surface recombination velocity as low as 3.3 cm/s with a corresponding surface dark saturation current density of 8.4 fA/cm 2

© 2018 Elsevier B.V. The origins of an increase in the series resistance of PERC multicrystalline silicon solar cells due to post-firing thermal processes are investigated. This effect has been shown to be capable of reducing the fill factor of finished cells by up to 20%ABS, severely degrading their performance. It is observed that electric currents applied either during or after these thermal processes can greatly alter the series resistance, either causing it to increase by more than an order of magnitude or suppressing the effect entirely. It is demonstrated that this behavior is in good agreement with the expected interactions of hydrogen with dopants and electric fields within silicon wafers. It is therefore speculated that at least part of the observed increase in resistance is due to the motion of hydrogen within the cell itself.

© 2018 Author(s). This paper presents a model for the introduction and redistribution of hydrogen in silicon solar cells at temperatures between 300 and 700 °C based on a second order backwards difference formula evaluated using a single Newton-Raphson iteration. It includes the transport of hydrogen and interactions with impurities such as ionised dopants. The simulations lead to three primary conclusions: (1) hydrogen transport across an n-type emitter is heavily temperature dependent; (2) under equilibrium conditions, hydrogen is largely driven by its charged species, with the switch from a dominance of negatively charged hydrogen (H-) to positively charged hydrogen (H+) within the emitter region critical to significant transport across the junction; and (3) hydrogen transport across n-type emitters is critically dependent upon the doping profile within the emitter, and, in particular, the peak doping concentration. It is also observed that during thermal processes after an initial high temperature step, hydrogen preferentially migrates to the surface of a phosphorous doped emitter, drawing hydrogen out of the p-type bulk. This may play a role in several effects observed during post-firing anneals in relation to the passivation of recombination active defects and even the elimination of hydrogen-related defects in the bulk of silicon solar cells.

© 2017 The Authors The alneal is one of the most effective methods of electrically passivating a silicon surface, and has been used by numerous research groups since the 1980s. In this work, we present an enhanced alneal process that substantially improves its effectiveness. Previously, the success afforded by the standard alneal has been attributed to the chemical passivation provided by hydrogenation of the Si-SiO2 interface. However, the work presented here shows that it is possible to enhance the surface passivation by simultaneously introducing a component of Field Effect Passivation (FEP). Where the standard alneal is seen to provide lifetimes of ~2.1 ms, equivalent to a surface recombination velocity (SRV) of 3.3 cm/s, the enhanced alneal can provide a lifetime of 5.6 ms on 1 Ω cm, n-type Si, equivalent to a SRV 0.4 cm/s. The charge required for this enhanced passivation can be introduced in the order of minutes and has the potential to be introduced at the same time as the aluminium is deposited, thus, resulting in no extra processing time. Secondary ion mass spectroscopy showed that the nature of the charge is likely to be K and Na cations residing at the Si-SiO2 interface. The possibility of increasing the surface passivation beyond that of the standard alneal points to the importance of both chemical and field effect components of passivation, and is therefore of significant interest to high efficiency silicon solar cell research.