Peter Nellist

Selected Publications

  • Phase reconstruction using fast binary 4D STEM data

  • The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials.

  • Targeted T1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe2O4 Nanoparticles.

  • Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy.

  • High dose efficiency atomic resolution imaging via electron ptychography.

  • Low-Dose Aberration-Free Imaging of Li-Rich Cathode Materials at Various States of Charge Using Electron Ptychography.

  • Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM.

  • 4D Analytical STEM with the pnCCD

  • Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images.

  • Subsampled STEM-ptychography

  • More
List of site pages