Image reconstruction techniques for super-resolution electron microscopy
A Kirkland
We are developing techniques for reconstructing the exit wavefunction of various specimens from images recorded with different focus values or with different illumination tilts. In this way it is possible to obtain fully quantitative structural data at higher resolution than the instrinsic limit set by the optics of the electron microscope. This project will apply this approach to a variety of nanomaterials with the aim of understanding their structure property relationships at higher spatial resolution than is otherwise possible.
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