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Grigore Moldovan

Dr Grigore Moldovan
Senior Research Fellow

Department of Materials
University of Oxford
16 Parks Road
Oxford OX1 3PH
UK

Tel: +44 1865 273661 (Room 154.30.15)
Tel: +44 1865 273700 (switchboard)
Fax: +44 1865 273789 (general fax)

Electron Microscopy Group

Summary of Interests

Grigore Moldovan is working on the development of a new electron detector for imaging in TEM. The aim is to record the positions of all electrons at the detector plane, which can then be used to construct images, diffraction patterns or videos. This will lead to frameless operation, unlimited dynamic range and a very good efficiency. Experiments that will benefit are in the areas of in-situ studies, quantitative TEM and electron microscopy of biological specimens.

Grigore has a background in device processing, device characterisation, electron microscopy and image analysis. He has previously worked as an Associated Researcher with the Cambridge Group for Gallium Nitride in the Department of Materials Science and Metallurgy, University of Cambridge.

Grigore is also Research Fellow of Wolfson College.

Research Publications

Konstantin B. Borisenko, Grigore Moldovan, Angus I. Kirkland, Dirk Van Dyck, Hsin-Yu Tang and Fu-Rong Chen, Toward electron exit wave tomography of amorphous materials at atomic resolution, Journal of Alloys and Compounds, vol. in press, doi: 10.1016/j.jallcom.2011.11.095 , 2012.

Anna-Clare Milazzo, Grigore Moldovan, Jason Lanman, Liang Jin, James C. Bouwer, Stuart Klienfelder, Steven T. Peltier, Mark H. Ellisman, Angus I. Kirkland and Nguyen-Huu Xuonga, Characterization of a direct detection device imaging camera for transmission electron microscopy, Ultramicroscopy, vol. 110, no. 7, pp. 744-747, 2010.

Moldovan Grigore, Jeffery B., Nomerotski A. and Kirkland Angus, Direct electron detection for TEM with column parallel CCD, Nucl. Instr. and Meth. A, vol. doi:10.1016/j.nima.2009.01.038, 2009.

Moldovan Grigore, Jeffery B., Nomerotski A. and Kirkland Angus, Imaging modes for direct electron detection in TEM with Column Parallel CCD, Nucl. Instr. and Meth. A, vol. doi: 10.1016/j.nima.2009.03.105, 2009.

John Matheson, Grigore Moldovan, A. Clark, M. Prydderch, R. Turchetta, G. Derbyshire, Angus Kirkland and Nigel Allinson, Characterisation of a monolithic active pixel sensor for electron detection in the energy range 10–20 keV, Nuclear Instruments and Methods in Physics Research Section A, vol. 608, no. 1, pp. 199-205, 2009.

Grigore Moldovan and Angus I Kirkland, Imaging electron detectors for low-voltage TEM, Inst. Phys. Conf. Ser. Proc. (EMAG), 2009.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Counting Electrons in Transmission Electron Microscopes, Microsc. Microanal. Proc., 2008.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Direct electron detectors for TEM, European Microscopy Congress Proceedings, 2008.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Thin silicon strip devices for direct electron detection in transmission electron microscopy, Nuclear Instruments and Methods in Physics Research A, vol. 591, pp. 134-137, 2008.

Moldovan Grigore, Matheson J, Derbyshire G and Kirkland Angus,Characterisation of a detector based on microchannel plates for electrons in the energy range 10-20keV, Nuclear Instruments and Methods in Physics Research A, vol. doi:10.1016/j.nima.2008.08.057, 2008.

Moldovan Grigore, Kazemian P, Edwards PR, Ong VKS, Kurniawan O and Humphreys J, Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices, Ultramicroscopy, vol. 107, pp. 382-389, 2007.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Can direct electron detectors outperform phosphor-CCD systems for TEM?, Inst. Phys. Conf. Ser. Proc. (EMAG), 2007.

Ong VKS, Kurniawan O, Moldovan Grigore and Humphreys J, A method of accurately determining the positions of the edges of depletion regions in semiconductor junctions, J. App. Phys., vol. 100, no. 114501, 2006.

Moldovan Grigore, Roe M, Harrison I, Kappers M, Humphreys CJ and Brown PD, Effects of KOH etching on the properties of Ga-polar n-GaN surfaces, Phil. Mag., vol. 86, no. 16, pp. 2315-2327, 2006.

Moldovan Grigore, Phillips A, Thrush EJ and Humphreys CJ, Temperature current-voltage characterisation of MOCVD grown InGaN/GaN MQW LEDs, Phys. Stat. Solidi (c) (ICNS-6), vol. 3, no. 6, pp. 2145-2148, 2006.

Fay MW, Moldovan Grigore, Weston NJ, Brown PD, Harrison I, Hilton KP, Masterton A, Wallis D, Balmer RS, Uren MJ and Martin T, Structural and electrical characterization of AuPdAlTi ohmic contacts to AlGaN/GaN with varying Ti content, J. App. Phys., vol. 95, no. 10, pp. 5588-5595, 2004.

Moldovan Grigore, Harrison I, Humphreys CJ, Kappers M and Brown PD,Application of the Taguchi method for the assessment of surface treatment procedures for Ti/n-type GaN contacts, Materials Characterization and Technology, vol. 20, no. 4, pp. 533-538, 2004.

Moldovan Grigore, Harrison I and Brown PD, Noise deconvolution for area-fraction measurement, Materials Characterization and Technology, vol. 20, no. 1, pp. 16-20, 2004.

Moldovan Grigore, Harrison I, Roe M and Brown PD, Correlation of electrical and structural properties of metal contacts to GaN, Inst. Phys. Conf. Ser. (EMAG), vol. 179, pp. 115-118, 2003.

Fay MW, Moldovan Grigore, Harrison I, Larkins E, Novikov SV, Foxon CT, Balmer RS, Soley AEJ, Hilton KP, Uren MJ, Martin T and Brown PA,Characterisation of nitrides by energy filtered TEM and EELS, 5-th Inter. Conf. on Nitride Semicond. Proc. (ICNS-5), pp. 2452-2455, 2003.

Kong CJ, Moldovan Grigore, Fay MW, McCartney D and Brown PD,Characterisation of Sn dispersions with annealed HVOLF thermally sprayed AnSnCu coatings, Inst. Phys. Conf. Ser. (EMAG), vol. 179, pp. 245-248, 2003.

Moldovan Grigore, Harrison I and Brown PD, EBIC studies of Au/n-type GaN Schottky contacts, Inst. Phys. Conf. Ser., (MSM), vol. 180, pp. 577-580, 2003.

Fay MW, Moldovan Grigore, Brown PD, Harrison I, Balmer RS, Birbeck JC, Hilton KP, Hughes BT, Uren MJ and Martin T, TEM studies of multilayer ohmic contacts to n-type AlGaN/GaN, nst. Phys. Conf. Ser. (MSM), vol. 180, pp. 483-486, 2003.

Fay MW, Moldovan Grigore, Harrison I, Balmer RS, Hilton KP, Hughes BT, Uren MJ, Martin T and Brown PD, Comparative morphology of AuTiAlTi, AuPdAlTi and AuAlTi ohmic contacts to AlGaN/GaN, Mat. Res. Soc. Symp. Proc., vol. 743, pp. 801-806, 2003.

Fay MW, Moldovan Grigore, Brown PD, Harrison I, Birbeck JC, Hughes BT, Uren MJ and Martin T, Structural and electrical characterisation of AuTiAlTi/AlGaN/GaN ohmic contacts, J. App. Phys., vol. 92, no. 1, pp. 94-100, 2002.

Fay MW, Moldovan Grigore, Harrison I, Birbeck JC, Hughes BT, Uren MJ, Martin T and Brown PD, TEM assessment of GaN/AlGaN/TiAlTiAu and GaN/AlGaN/TiAlPdAu ohmic contacts, Mat. Res. Soc. Symp. Proc., vol. 693, pp. l11.43.1-I11.43.6, 2002.

Morley KS, Marr PC, Webb PB, Berry AR, Allison FJ, Moldovan Grigore, Brown PD and Howdle, Clean preparation of nanoparticulate metals in porous supports: a supercritical route, J. Mat. Chem., vol. 12, pp. 1898-1905, 2002.

Moldovan Grigore, Marlafeka S, Harrison I and Brown PD, Surface preparation for contacting GaN, Inst. Phys. Conf. Ser. (EMAG), vol. 168, pp. 257-360, 2001.